Parameter estimation for a thin layer by measuring temperature induced by a heat source

Hongyun Wang, Hong Zhou

Abstract


We study the temperature profile for a semi-infinite thin layer due to a Gaussian heat source. We follow the time-dependent temperature profile at the center of the top surface of the layer, deriving the asymptotic behavior and both the short time and long time behaviors. We also show that one can estimate thermal properites from various time measurements of the temperature at the center of the top surface. Finally, we investigate the statistical uncertainty in estimating parameter values from temperature measurements.

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How to Cite this Article:

Hongyun Wang, Hong Zhou, Parameter estimation for a thin layer by measuring temperature induced by a heat source, Journal of Mathematical and Computational Science, Vol 3, No 6 (2013), 1353-1372

Copyright © 2013 Hongyun Wang, Hong Zhou. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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